Search NASA⌕ Search
Home/Archive/NASA NTRS

NASA NTRS · 20205007083

Microsemi PolarFire® Field Programmable Gate Array Single Event Effects Test Report

Melanie Berg·Hak Kim·Michael Campola·Jonathan Pellish
View original source ↗Export metadata ↓

Abstract

The source did not provide an abstract. Follow the original record for more information.

Explore related subjects

Field Programmable Gate Array (FPGA)single event effect (SEE)Single Event Transient (SET)Single Event Upset (SEU)single event functional interrupt (SEFI)single event latch-up (SEL)single event failure (SEF)

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Melanie Berg, Hak Kim, Michael Campola, Jonathan Pellish. 2019-12-15. Microsemi PolarFire® Field Programmable Gate Array Single Event Effects Test Report. https://ntrs.nasa.gov/citations/20205007083

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

NASA NTRS2019

Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

The goal of this study was to perform an independent investigation of single event destructive and transient susceptibility of the Microsemi RTG4 device. The devices under test were the Microsemi RTG4 field programmable gate array (FPGA) Rev C. The devices under test will be referenced as the DUT or RTG4 Rev C throughout this document. The DUT was configured to have various test structures that are geared to measure specific potential susceptibilities of the device. DesignDevice susceptibility was determined by monitoring the DUT for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) was checked throughout heavy-ion testing by monitoring device current.

Field Programmable Gate Array (FPGA)↗
NASA NTRS2018

Commercial Off-The-Shelf (COTS) Electronics Reliability for Space Applications

This presentation describes the accelerating use of Commercial off the Shelf (COTS) parts in space applications. Component reliability and threats in the context of the mission, environment, application, and lifetime. Provides overview of traditional approaches applied to COTS parts in flight applications, and shows challenges and potential paths forward for COTS systems in flight applications it's all about data!

Field Programmable Gate Array (FPGA)↗