Single-Event Transient Case Study for System-Level Radiation Effects Analysis

M Campola; R Ladbury; R Austin; E Wilcox; J Pellish; H Kim; K LaBel

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NASA NTRS · 20205009687

Single-Event Transient Case Study for System-Level Radiation Effects Analysis

M Campola·R Ladbury·R Austin·E Wilcox·J Pellish·H Kim·K LaBel

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Abstract

Analog single-event transient results are analyzed for two applications with a system architecture in mind. Application-specific analyses are presented on the MAX4595 commercial device using single-event effects criticality and goal structuring notation.

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Single-event effects single-event transients radiation system-level effects

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M Campola, R Ladbury, R Austin, E Wilcox, J Pellish, H Kim, K LaBel. 2020-12-07. Single-Event Transient Case Study for System-Level Radiation Effects Analysis. https://ntrs.nasa.gov/citations/20205009687

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