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NASA NTRS · 20210001305

Degradation of Precision Reference Devices in Space Environments

Abstract

This paper presents radiation test results for several different precision voltage devices. Their degradation is compared to that expected for the basic bandgap reference circuit, which is used as a theoretical benchmark, and uses only npn transistorss.

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BibTeXRIS

Johnson, A. H., Lee, C. I., Rax, B. G.. 1997-07-04. Degradation of Precision Reference Devices in Space Environments. https://ntrs.nasa.gov/citations/20210001305

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