NASA NTRS ยท 20210001356
Virtex-5 CN package daisy chain evaluation test report
Abstract
The board-level temperature cycling reliability of Xilinx Virtex-5 CN package was investigated.
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Suh, Jong-ook. 2016-01-01. Virtex-5 CN package daisy chain evaluation test report. https://ntrs.nasa.gov/citations/20210001356
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