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NASA NTRS · 20210002951

Displacement Damage in Bipolar Linear Integrated Circuits

Miyahira, T.·Johnston, A.·Rax, B.
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Abstract

Although many different processes can be used to manufacture linear integrated circuits, the process that is used for most circuits is optimized for high voltage -- a total power supply voltage of about 40 V -- and low cost.

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Miyahira, T., Johnston, A., Rax, B.. 1999-07-12. Displacement Damage in Bipolar Linear Integrated Circuits. https://ntrs.nasa.gov/citations/20210002951

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