Cost Effective Assessment of System Reliability Using Data From Subsystem/Assembly Level Testing

Krasich, Millena

NASA NTRS · 20210005067

Cost Effective Assessment of System Reliability Using Data From Subsystem/Assembly Level Testing

Abstract

The paper describes a simple method developed to use and combine subsystem or assembly level accelerated test results withthe system level test results to estimate achieved overall system reliability.

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achieved reliability goal assembly level test time system acceleration subsystem

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BibTeX RIS

Krasich, Millena. 1996-05-13. Cost Effective Assessment of System Reliability Using Data From Subsystem/Assembly Level Testing. https://ntrs.nasa.gov/citations/20210005067

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