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NASA NTRS · 20210008174

Radiation Performance of Memory Technologies for Space Applications

Abstract

MRAM and DRAM memory technologies identified for possible radiation hardening were investigated for memory-array- and controller-level radiation sensitivity. TID and SEE performance of memory arrays and associated cells is good, but with some questions about viability of hardening of problematic control circuitry. Control-circuitry-related SEE problems are highlighted. TID data are focused on memory arrays only.

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BibTeXRIS

Some, Raphael, Yang-Scharlotta, Jean, Guertin, Steven M.. 2018-03-12. Radiation Performance of Memory Technologies for Space Applications. https://ntrs.nasa.gov/citations/20210008174

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