Search NASA⌕ Search

DOE OSTI · 1056964

Classifying Soft Error Vulnerabilities in Extreme-Scale Scientific Applications Using a Binary Instrumentation Tool

Abstract

The source did not provide an abstract. Follow the original record for more information.

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Li, Dong, Vetter, Jeffrey S, Yu, Weikuan. 2012-01-01. Classifying Soft Error Vulnerabilities in Extreme-Scale Scientific Applications Using a Binary Instrumentation Tool. https://www.osti.gov/biblio/1056964

Cite the original work for its findings. Save a collection to share your selection of sources.