Electron microscopy: Phase transition singled out

Abstract

One of the fundamental challenges within nanotechnology is to understand and control how nanoscale properties are initiated, evolve, and eventually terminate as a system moves from an individual nanostructure towards the meso- and macro-scale ensembles that are used in most applications. The ability to directly observe individual nanostructures and characterize their structure and composition has long been within the purview of transmission electron microscopy (TEM). The almost ubiquitous application of spherical aberration correction in TEM and in scanning-TEM (STEM) that has occurred over the last 10 years, now means it is possible to routinely characterize such nanostructures with both atomic resolution and sensitivity [1,2]. The development of temporal resolution in the TEM and the ability to study fast dynamics, on the other hand, has only recently come to the forefront of instrumentation development and is currently defined by two different approaches in the use of photoemission sources: the single shot s-ns dynamic TEM (DTEM) [3] and the stroboscopic ps-fs 4-D EM [4]. In the case of the DTEM, the goal is to observe the longer timescale irreversible structural changes that occur during nucleation and growth phenomena (here the single shot approach means there are enough electrons in a single pulsed beam to form a complete image). The 4-D EM focuses on a stroboscopic approach with the goal of studying very rapid reversible effects that occur during phase transitions (here an image is composed of thousands of pump-probe events each occurring with exactly the same time signature, with an individual pulse containing only a few electrons).