Identifying single electron charge sensor events using wavelet edge detection

Prance, J. R.; Bael, B. J. Van; Simmons, C. B.; Savage, D. E.; Lagally, M. G.; Friesen, Mark; Coppersmith, S. N.; Eriksson, M. A.

doi:10.1088/0957-4484/26/21/215201

DOE OSTI · 1238968

Identifying single electron charge sensor events using wavelet edge detection

Prance, J. R.·Bael, B. J. Van·Simmons, C. B.·Savage, D. E.·Lagally, M. G.·Friesen, Mark·Coppersmith, S. N.·Eriksson, M. A.

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Prance, J. R., Bael, B. J. Van, Simmons, C. B., Savage, D. E., Lagally, M. G., Friesen, Mark, Coppersmith, S. N., Eriksson, M. A.. 2015-05-01. Identifying single electron charge sensor events using wavelet edge detection. https://doi.org/10.1088/0957-4484%2F26%2F21%2F215201

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