Ideal Scan Path for High-Speed Atomic Force Microscopy

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Ziegler, Dominik, Meyer, Travis R., Amrein, Andreas, Bertozzi, Andrea L., Ashby, Paul D.. 2017-02-01. Ideal Scan Path for High-Speed Atomic Force Microscopy. https://doi.org/10.1109/tmech.2016.2615327

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