Statistical Framework for Planning a Component Shelf Life Program.

Abstract

This document outlines a statistical framework for establishing a shelf-life program for components whose performance is measured by the value of a continuous variable such as voltage or function time. The approach applies to both single measurement devices and repeated measurement devices, although additional process control charts may be useful in the case of repeated measurements. The approach is to choose a sample size that protects the margin associated with a particular variable over the life of the component. Deviations from expected performance of the measured variable are detected prior to the complete loss of margin. This ensures the reliability of the component over its lifetime.