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DOE OSTI · 1392253

SRF cavity testing using a FPGA Self Excited Loop

Abstract

Various authors have previously studied the theory and practice of cavity testing, notably an extensive treatment by Powers [1] and Padamsee [2]. The advent of the digital Low Level RF (LLRF) electronics based on Field Programmable Logic Arrays (FPGA) provides various improvements over the rather complex systems used in the past as well as enabling new measurement techniques.In this document we reintroduce a technique that seems to have fallen out of practice in recent times, that is obtaining the coupling constant β through measurements from just one port, the reflected power port, of the directional coupler placed in front of the cavity.

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BibTeXRIS

Ben-Zvi, I.. 2017-08-30. SRF cavity testing using a FPGA Self Excited Loop. https://doi.org/10.2172/1392253

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