DOE OSTI · 1458517
SRF Cavity Testing Using a FPGA Self Excited Loop
Abstract
This document provides a detailed description of procedures for very-high precision calibration and testing of superconducting RF cavities using digital Low-Level RF (LLRF) electronics based on Field Programmable Gate Arrays (FPGA). The use of a Self-Excited Loop with an innovative procedure for fast turn-on allows the measurement of the forward, reflected and transmitted power from a single port of the directional coupler in front of the cavity, thus eliminating certain measurement errors. Various procedures for measuring the quality factor as a function of cavity fields are described, including a single RF pulse technique. Errors are estimated for the measurements.
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Ben-Zvi, Ilan. 2017-08-30. SRF Cavity Testing Using a FPGA Self Excited Loop. https://doi.org/10.2172/1458517
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