DOE OSTI · 1461044
Atomic Force Microscopy Beyond the Standard Quantum Limit
Abstract
We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.
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Lawrie, Benjamin J., Pooser, Raphael C.. 2018-05-01. Atomic Force Microscopy Beyond the Standard Quantum Limit. https://doi.org/10.1364/cleo_at.2018.jf2b.3
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