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DOE OSTI · 1531955

Error-correction coding for hot-swapping semiconductor devices

Roberts, David A.
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Abstract

A memory read operation is directed at a group of semiconductor devices from which a first semiconductor device has been removed. An error in data for the memory read operation is detected based on error-correction coding (ECC). The error is caused at least in part by the first semiconductor device having been removed. ECC is used to determine corrected data for the memory read operation.

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BibTeXRIS

Roberts, David A.. 2016-11-01. Error-correction coding for hot-swapping semiconductor devices. https://www.osti.gov/biblio/1531955

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