Oxybarometry and valence quantification based on microscale X-ray absorption fine structure (XAFS) spectroscopy of multivalent elements

Sutton, S. R. (ORCID:0000000253626280); Lanzirotti, A.; Newville, M.; Dyar, M. Darby (ORCID:000000034272793X); Delaney, J.

doi:10.1016/j.chemgeo.2019.119305

DOE OSTI · 1575029

Oxybarometry and valence quantification based on microscale X-ray absorption fine structure (XAFS) spectroscopy of multivalent elements

Sutton, S. R. (ORCID:0000000253626280)·Lanzirotti, A.·Newville, M.·Dyar, M. Darby (ORCID:000000034272793X)·Delaney, J.

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Sutton, S. R. (ORCID:0000000253626280), Lanzirotti, A., Newville, M., Dyar, M. Darby (ORCID:000000034272793X), Delaney, J.. 2020-01-01. Oxybarometry and valence quantification based on microscale X-ray absorption fine structure (XAFS) spectroscopy of multivalent elements. https://doi.org/10.1016/j.chemgeo.2019.119305

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