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DOE OSTI ยท 1606316

Guide to Making XPS Measurements on Nanoparticles

Abstract

This guide briefly summarizes issues and considerations important for the use of X-ray Photoelectron Spectroscopy (XPS) for characterizing nanoparticles, which are important in many areas of science and technology. Because the surfaces play a major role in determining nanoparticle behaviors, XPS is an increasingly useful tool for understanding their properties, including addressing variations and non-reproducibility issues associated with these materials. The unusual physical and chemical behaviors of these particles must be considered in preparing and characterizing these materials. This guide is one of a series intended to highlight best practices in the use of XPS.

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BibTeXRIS

Baer, Donald R.. 2020-05-01. Guide to Making XPS Measurements on Nanoparticles. https://doi.org/10.1116/1.5141419

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