Full strain tensor measurements with X-ray diffraction and strain field mapping: a simulation study

Tang, M. X.; Huang, J. W.; E, J. C.; Zhang, Y. Y.; Luo, S. N.

doi:10.1107/s1600577520003926

DOE OSTI · 1630340

Full strain tensor measurements with X-ray diffraction and strain field mapping: a simulation study

Tang, M. X.·Huang, J. W.·E, J. C.·Zhang, Y. Y.·Luo, S. N.

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Tang, M. X., Huang, J. W., E, J. C., Zhang, Y. Y., Luo, S. N.. 2020-05-22. Full strain tensor measurements with X-ray diffraction and strain field mapping: a simulation study. https://doi.org/10.1107/s1600577520003926

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