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DOE OSTI · 1632202

Space-charge effects in ionization beam profile monitors

Shiltsev, Vladimir
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Abstract

Ionization profile monitors (IPMs) are widely used in accelerators for non-destructive and fast diagnostics of high energy particle beams. At high beam intensities, the space-charge forces make the measured IPM profiles significantly different from those of the beams. We analyze dynamics of the secondaries in IPMs and develop an effective algorithm to reconstruct the beam sizes from the measured IPM profiles. Efficiency of the developed theory is illustrated in application to the Fermilab 8 GeV proton Booster IPMs.

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43 PARTICLE ACCELERATORS72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDSBeam diagnosticsIonizationSpace-charge effects

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BibTeXRIS

Shiltsev, Vladimir. 2020-10-09. Space-charge effects in ionization beam profile monitors. https://doi.org/10.1016/j.nima.2020.164744

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