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DOE OSTI · 1632523

Global analysis peak fitting for chemical spectroscopy data

Van Benthem, Mark·Ohlhausen, James A.
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Abstract

The present invention relates to methods for analyzing a chemical sample. For instance, the methods herein allow for global analysis of spectroscopy data in order to extract useful chemical properties from complicated multidimensional data. Such analysis can optionally employ data compression to further expedite computer-implemented computation. In particular, the methods herein provide global analysis of data matrices explained by both linear and non-linear terms.

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37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY97 MATHEMATICS AND COMPUTING

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BibTeXRIS

Van Benthem, Mark, Ohlhausen, James A.. 2020-02-04. Global analysis peak fitting for chemical spectroscopy data. https://www.osti.gov/biblio/1632523

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