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DOE OSTI · 1633735

Validating Extreme Scale Resilience with Veracity (Final Project Report)

Erez, Mattan·Orshansky, Michael·Chiou, Derek
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Abstract

As semiconductor technology continues to scale to smaller dimensions and as power-consumption of processor chips continues to increase in importance, there is significant uncertainty about the reliability of future large-scale computers. This uncertainty impacts algorithm design and application development, as well as decisions about system operation policy and provisioning decisions. The Veracity endeavored to answer pertinent questions regarding system reliability and resilience with the goal of enabling reliable science on future leadership machines while keeping overprovisioning low.

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Erez, Mattan, Orshansky, Michael, Chiou, Derek. 2020-06-18. Validating Extreme Scale Resilience with Veracity (Final Project Report). https://doi.org/10.2172/1633735

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