Search NASA⌕ Search

DOE OSTI · 1637354

Node failure resiliency for Uintah without checkpointing

Abstract

The frequency of failures in upcoming exascale supercomputers may well be greater than at present due to many-core architectures if component failure rates remain unchanged. This potential increase in failure frequency coupled with I/O challenges at exascale may prove problematic for current resiliency approaches such as checkpoint restarting, although the use of fast intermediate memory may help. Algorithm-Based Fault Tolerance (ABFT) using Adaptive Mesh Refinement (AMR) is one resiliency approach used to address these challenges. For adaptive mesh codes, a coarse mesh version of the solu- tion may be used to restore the fine mesh solution. This paper addresses the implementation of the ABFT approach within the Uintah software framework: both at a software level within Uintah and in the data reconstruction method used for the recovery of lost data. This method has two problems: inaccuracies introduced during the reconstruction propagate forward in time, and the physical consistency of variables such as positivity or boundedness may be violated during interpolation. These challenges can be addressed by the combination of two techniques: 1. a fault-tolerant MPI implementation to recover from runtime node failures, and 2. high-order interpolation schemes to preserve the physical solution and reconstruct lost data. Here, the approach considered here uses a "Limited Essentially Non-Oscillatory" (LENO) scheme along with AMR to rebuild the lost data without checkpointing using Uintah. Experiments were carried out using a fault-tolerant MPI - ULFM to recover from runtime failure, and LENO to recover data on patches belonging to failed ranks, while the simulation was continued to the end. Results show that this ABFT approach is up to 10x faster than the traditional checkpointing method. The new interpolation approach is more accurate than linear interpolation and not subject to the overshoots found in other interpolation methods.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Sahasrabudhe, Damodar, Berzins, Martin, Schmidt, John. 2019-06-02. Node failure resiliency for Uintah without checkpointing. https://doi.org/10.1002/cpe.5340

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

TANTE: Time-adaptive operator learning via neural Taylor expansion

Operator learning for time-dependent partial differential equations (PDEs) has seen rapid progress in recent years, enabling efficient approximation of complex spatiotemporal dynamics. However, most existing methods rely on fixed time step sizes during rollout, which limits their ability to adapt to varying temporal complexity and often leads to error accumulation. In this work, we propose the Time-Adaptive Transformer with Neural Taylor Expansion (TANTE), a novel operator-learning framework that produces continuous-time predictions with adaptive step sizes. TANTE predicts future states by performing a Taylor expansion at the current state, where neural networks learn both the higher-order temporal derivatives and the local radius of convergence. This allows the model to dynamically adjust its rollout based on the local behavior of the solution, thereby reducing cumulative error and improving computational efficiency. We demonstrate the effectiveness of TANTE across a wide range of PDE benchmarks, achieving superior accuracy and adaptability compared to fixed-step baselines, delivering accuracy gains of 60-80 % and speed-ups of 30-40 % at inference time.

97 MATHEMATICS AND COMPUTING↗

Structured illumination for surface-resolved grazing-incidence X-ray scattering

Grazing-incidence (GI) scattering techniques are widely used to characterize thin films, offering high surface sensitivity and insight into morphology and structure. However, these approaches typically provide statistical averaged information due to elongated footprint or limited spatial resolution due to beam size. Here we introduce a method that combines structured illumination with GI X-ray scattering and leverages our computational imaging approach to resolve local structural details. We demonstrate that our method captures local features of an organic semiconductor thin film without the need for sample rotation as in tomography. The method expands GI techniques from statistical averaging to high-resolution imaging, thereby providing the capability for detailed analysis of local material properties, such as domain shape, orientation and polymorphism, which are critical for advancing material design towards more efficient and tailored materials.

97 MATHEMATICS AND COMPUTING↗