Thermal loading on self-seeding monochromators in x-ray free electron lasers

Qu, Zhengxian; Ma, Yanbao; Zhou, Guanqun; Wu, Juhao

doi:10.1016/j.nima.2020.163936

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Thermal loading on self-seeding monochromators in x-ray free electron lasers

Qu, Zhengxian·Ma, Yanbao·Zhou, Guanqun·Wu, Juhao

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Abstract

One approach to achieve longitudinally coherent hard X-ray free electron laser (XFEL) radiation is to introduce a single-crystal monochromator in the beam path to generate a co-propagating, time-synchronized self-seeding radiation pulse. For modern high-repetition rate XFELs, however, thermal loading on the crystal can degrade the quality of the seed pulse. To assess limitations on the maximum XFEL pulse repetition rate imposed by the seeding crystal, a comprehensive study of thermomechanical, and X-ray diffraction effects within the crystal is presented in this paper for two consecutive self-amplified spontaneous emission pulses incident on both reflective and transmissive crystal monochromators.

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Qu, Zhengxian, Ma, Yanbao, Zhou, Guanqun, Wu, Juhao. 2020-04-15. Thermal loading on self-seeding monochromators in x-ray free electron lasers. https://doi.org/10.1016/j.nima.2020.163936

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