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DOE OSTI · 1639621

Wafer-scale TaOx device variability and implications for neuromorphic computing applications.

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Bennett, Christopher, Garland, Diana, Jacobs-Gedrim, Robin B, Agarwal, Sapan, Marinella, Matthew. 2019-04-01. Wafer-scale TaOx device variability and implications for neuromorphic computing applications.. https://doi.org/10.1109/irps.2019.8720596

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