DOE OSTI · 1661661
Probing Diffuse Polymer Brush Interfaces Using Resonant Soft X-ray Scattering
Abstract
The success of a neutron or x-ray scattering experiment relies on sufficient signal from the system being studied. The intensity of scattered radiation depends on instrument resolution, the structure of the scattering elements, and the interaction between the incident radiation and the sample—so-called ‘scattering contrast’. The contrast depends on the square of the difference in the scattering length densities (SLDs) for each component, and each SLD depends on the atoms and radiation involved (eq. 1). For neutrons, the scattering lengths bi are specific to the type of nuclei involved. For conventional x-ray scattering, b i depends on the electron density and thus the atomic number Z.
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De Hoe, Guilhem X., Mao, Jun, Jiang, Zhang, Darling, Seth B., Tirrell, Matthew V., Chen, Wei. 2020-08-25. Probing Diffuse Polymer Brush Interfaces Using Resonant Soft X-ray Scattering. https://doi.org/10.1080/08940886.2020.1784698
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