DOE OSTI · 1726050
Evaluating Interconnection Schemes for Semi-Transparent Perovskite Mini-Modules
Abstract
This work evaluates the critical issues surrounding P1, P2, and P3 scribing for semi-transparent perovskite module integration. We find that P1 scribing procedures are well-translated from other thin-film technologies. P2 scribing is best performed with a mechanical scribe, but remains a source of series resistance. P3 scribing is found to cause an increase in scribing dead area and a potential degradation source.
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Bailie, Colin, Eberspacher, Chris, Gehan, Timothy, Bramante, Rosemary, van Hest, Maikel. 2020-10-08. Evaluating Interconnection Schemes for Semi-Transparent Perovskite Mini-Modules. https://www.osti.gov/biblio/1726050
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