Solving electrical impedance tomography with deep learning

Fan, Yuwei (ORCID:0000000195666996); Ying, Lexing (ORCID:0000000315471457)

doi:10.1016/j.jcp.2019.109119

DOE OSTI · 1775905

Solving electrical impedance tomography with deep learning

Fan, Yuwei (ORCID:0000000195666996)·Ying, Lexing (ORCID:0000000315471457)

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Fan, Yuwei (ORCID:0000000195666996), Ying, Lexing (ORCID:0000000315471457). 2020-03-01. Solving electrical impedance tomography with deep learning. https://doi.org/10.1016/j.jcp.2019.109119

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