Ion-temperature determination with a baffled Langmuir probe

Abstract

An electrostatic Langmuir probe for real-time measurements of parameters in magnetized plasma is tested in fully ionized, barium, Q-machine plasma. The small-diameter, long-length, tungsten wire sensor, i.e., the probe tip, oriented with its cylindrical axis perpendicular to the magnetic field (B), is partially shielded by ceramic baffles, or masks, that form sensor-access slots between the baffles. Adjusting the azimuthal orientation of the slots, by rotating the probe about its cylindrical axis, changes the fraction of proximity gyro-orbiting electrons, relative to the fraction of proximity gyro-orbiting ions, that can access the recessed sensor along the magnetic field. Thus, the ratio between the electron and ion saturation currents, $I^{sat}_e$ and $I^{sat}_i$, can be adjusted without having affected the probe bias voltage V b . When optimally shielded ($I^{sat}_e/I^{sat}_i$=1), accurate, real-time measurements of space potential Vs can be acquired. When maximally shielded ($I^{sat}_e/I^{sat}_i$ << 1), accurate, real-time measurements of ion temperature T i can be acquired. Subtracting the floating potential V f of an optimally shielded baffled probe from V f of a maximally shielded baffled probe yields T i (and its fluctuation phase) in real time.