Photo-cleaned Backgroundless Ion Chambers (Final Report for PDRD SR18010)

Abstract

Ion chambers are often employed to measure the concentration of tritium within flowing gases. In real world environments the active surfaces of ion chambers become covered with tritiated surface contaminants. This tritiated surface contamination will create a large background response that can mask the signature of interest, which is the tritium concentration in the gas phase. Previous efforts to reduce the effects of surface contamination in ion chambers utilize inert coatings (e.g., gold) and low surface area electrodes (e.g., wire mesh), but this route only reduces the effect and does not necessarily alter the ratio of surface contamination to current collection area. Additionally, gold coating may add a substantial cost to the instrument. In the Tritium Facility, ion chambers are periodically cleaned using an alcohol-based process. This process is time consuming and often leads to ion chamber wear and breakage. In addition, periodic cleaning does not address tritium level ambiguities in gloveboxes. An ideal solution to this issue would be to either develop an ion chamber that does not accrue surface contamination, or one that is self-cleaning while it is in operation.