DOE OSTI · 1833743
Dielectric screening in perovskite photovoltaics
Abstract
Abstract The performance of perovskite photovoltaics is fundamentally impeded by the presence of undesirable defects that contribute to non-radiative losses within the devices. Although mitigating these losses has been extensively reported by numerous passivation strategies, a detailed understanding of loss origins within the devices remains elusive. Here, we demonstrate that the defect capturing probability estimated by the capture cross-section is decreased by varying the dielectric response, producing the dielectric screening effect in the perovskite. The resulting perovskites also show reduced surface recombination and a weaker electron-phonon coupling. All of these boost the power conversion efficiency to 22.3% for an inverted perovskite photovoltaic device with a high open-circuit voltage of 1.25 V and a low voltage deficit of 0.37 V (a bandgap ~1.62 eV). Our results provide not only an in-depth understanding of the carrier capture processes in perovskites, but also a promising pathway for realizing highly efficient devices via dielectric regulation.
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Su, Rui (ORCID:0000000288611222), Xu, Zhaojian, Wu, Jiang, Luo, Deying (ORCID:0000000289777267), Hu, Qin (ORCID:0000000330891070), Yang, Wenqiang, Yang, Xiaoyu, Zhang, Ruopeng, Yu, Hongyu, Russell, Thomas P. (ORCID:0000000163845826), Gong, Qihuang, Zhang, Wei (ORCID:0000000226788372), Zhu, Rui (ORCID:0000000176313589). 2021-04-30. Dielectric screening in perovskite photovoltaics. https://doi.org/10.1038/s41467-021-22783-z
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