High-Quality Thermal Gibbs Sampling with Quantum Annealing Hardware

Nelson, Jon; Vuffray, Marc (ORCID:0000000179999897); Lokhov, Andrey Y. (ORCID:0000000332697263); Albash, Tameem (ORCID:0000000339163985); Coffrin, Carleton (ORCID:0000000332381699)

doi:10.1103/physrevapplied.17.044046

DOE OSTI · 1864874

High-Quality Thermal Gibbs Sampling with Quantum Annealing Hardware

Nelson, Jon·Vuffray, Marc (ORCID:0000000179999897)·Lokhov, Andrey Y. (ORCID:0000000332697263)·Albash, Tameem (ORCID:0000000339163985)·Coffrin, Carleton (ORCID:0000000332381699)

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Nelson, Jon, Vuffray, Marc (ORCID:0000000179999897), Lokhov, Andrey Y. (ORCID:0000000332697263), Albash, Tameem (ORCID:0000000339163985), Coffrin, Carleton (ORCID:0000000332381699). 2022-04-25. High-Quality Thermal Gibbs Sampling with Quantum Annealing Hardware. https://doi.org/10.1103/physrevapplied.17.044046

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