DOE OSTI · 1881908
In-Line Membrane Thickness Mapping with Real-Time Data Processing
Abstract
The goal of this project is commercialization of a novel, patented by NREL, non-contact, in-line quality control thickness mapping tool that will enable 100% area inspection of multilayer polymer film assemblies, such as a PEM on a casting substrate, during continuous high-volume R2R manufacturing.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Rupnowski, Peter (ORCID:000000030040418X). 2022-08-10. In-Line Membrane Thickness Mapping with Real-Time Data Processing. https://www.osti.gov/biblio/1881908
Cite the original work for its findings. Save a collection to share your selection of sources.