DOE OSTI · 1896428
Requirements for an in-house synchrotron radiation source at LANL
Abstract
Synchrotron measurements for diffraction characterization and high resolution tomography require: (1) unable monochromatic X-ray incident energy from 65keV to 100keV. 65keV need is defined by Ta and W absorption edges at 67keV, 100keV need is defined by need to penetrate U/Pu sample thickness of 0.5 mm (2) focused flux density of the monochromatic beam on a beam spot of ~100 µm 2 greater than 10 10 photons per second to allow some slower kinetics experiments such as heating, cooling for CTE measurements (but not quenching, solidification etc. which require <0.1 s resolution) (3) Δλ/λ resolution of 0.3% or better across the energy spectrum. This can be achieved by monochromator as long as flux needs are met in the monochromatic beam.
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Brown, Donald William, Vogel, Sven C.. 2022-10-31. Requirements for an in-house synchrotron radiation source at LANL. https://doi.org/10.2172/1896428
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