Search NASA⌕ Search

DOE OSTI · 1925002

Plasma-based edge terminations for gallium nitride power devices

Abstract

A p-n diode includes a first electrode, a n-GaN layer on the first electrode, a p-GaN layer on the n-GaN layer, and a second electrode on a first portion of the p-GaN layer. A region of the p-GaN layer surrounding the electrode is a passivated region. Treating a GaN power device having a p-GaN layer includes covering a portion of the p-GaN layer with a metal layer, exposing the p-GaN layer to a hydrogen plasma, and thermally annealing the p-GaN layer, thereby passivating a region of the p-GaN layer proximate the metal layer.

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Zhao, Yuji, Fu, Houqiang, Fu, Kai. 2022-08-16. Plasma-based edge terminations for gallium nitride power devices. https://www.osti.gov/biblio/1925002

Cite the original work for its findings. Save a collection to share your selection of sources.