Differential emissivity based evaporable particle measurement

Abstract

A differential emissivity imaging device for measuring evaporable particle properties can include a heated plate, a thermal camera, a memory device, and an output interface. The heated plate can have an upper surface oriented to receive falling evaporable particles. The evaporable particles have a particle emissivity and the upper surface has a plate surface emissivity. The thermal camera can be oriented to produce a thermal image of the upper surface. A memory device can include instructions that cause the imaging device to calculate a mass of the individual evaporable particle via heat conduction using a calculated surface area and an evaporation time.