DOE OSTI · 2373010
Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection
Abstract
The source did not provide an abstract. Follow the original record for more information.
Keep this discovery
Explore connections, maps & timelines
Roccapriore, Kevin, Ziatdinov, Maxim, Torsi, Riccardo, Robinson, Joshua A., Kalinin, Sergei V.. 2023-08-01. Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection. https://doi.org/10.1093/micmic%2Fozad067.184
Cite the original work for its findings. Save a collection to share your selection of sources.