Beam Test Results of the BTeV Silicon Pixel Detector

Kwan, Simon; Appel, J. A.; Butler, J. N.; Cardoso, G.; Cheung, H.; Chiodini, G.; Christian, D. C.; Gottschalk, Erik Edward; Hall, B. K.; Hoff, J.; Kasper, P. A.; Kutschke, Robert Kenneth; Mekkaoui, A.; Yarema, Raymond J.; Zimmermann, S.; Newsom, Charles R.; Colautti, A.; Menasce, D.; Sala, S.; Coluccia, R.; Di Corato, M.; Artuso, Marina; Wang, J. C.

doi:10.1109/nssmic.2000.949011

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Beam Test Results of the BTeV Silicon Pixel Detector

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Kwan, Simon, Appel, J. A., Butler, J. N., Cardoso, G., Cheung, H., Chiodini, G., Christian, D. C., Gottschalk, Erik Edward, Hall, B. K., Hoff, J., Kasper, P. A., Kutschke, Robert Kenneth, Mekkaoui, A., Yarema, Raymond J., Zimmermann, S., Newsom, Charles R., Colautti, A., Menasce, D., Sala, S., Coluccia, R., Di Corato, M., Artuso, Marina, Wang, J. C.. 2024-07-08. Beam Test Results of the BTeV Silicon Pixel Detector. https://doi.org/10.1109/nssmic.2000.949011

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