DOE OSTI · 2407014
Assessment of Accelerated Stress Testing Data for Silicon Photovoltaics Using Tensor Decomposition Methods
Abstract
The photovoltaic (PV) industry is simultaneously targeting long warranties and new materials/designs for high-energy-yield modules, requiring an advanced methodology to forecast long-term durability of products with un-proven materials combinations. Extended, sequential, and combined stress testing methods are gaining popularity for assessing durability of PV modules/materials beyond the early-stage mortalities. Importantly, multiple degradation mechanisms can proceed simultaneously, and their separate contributions to the overall power loss should ideally be quantified. This work examines the use of data-driven tools towards developing a strategy for faster learning cycles in accelerated stress testing.
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Glaws, Andrew, Kern, Dana B.. 2024-07-23. Assessment of Accelerated Stress Testing Data for Silicon Photovoltaics Using Tensor Decomposition Methods. https://www.osti.gov/biblio/2407014
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