DOE OSTI · 2418006
Gate-Driver Integrated Junction Temperature Estimation of SiC MOSFET Modules
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Mocevic, Slavko, Mitrovic, Vladimir, Wang, Jun, Burgos, Rolando, Boroyevich, Dushan. 2022-10-01. Gate-Driver Integrated Junction Temperature Estimation of SiC MOSFET Modules. https://doi.org/10.1109/jestpe.2021.3108442
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