Using real-time data analysis to conduct next-generation synchrotron fatigue studies

Abstract

Next-generation experimental techniques, like high energy X-ray diffraction microscopy (HEDM), usher in new opportunities to collect the grain-scale data necessary for understanding the evolving processes that drive fatigue failure. In this study, we present a framework for monitoring the evolution of a deforming polycrystal, in real-time, by applying principal component analysis (PCA) to raw X-ray diffraction image data. We applied this framework to inform in-situ HEDM measurements of a cyclically loaded Inconel-718 superalloy. Further, we discovered correlations between PCA of the diffraction data and the physical processes in the polycrystal. Lastly, we discuss extending this framework in future HEDM fatigue studies.