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DOE OSTI · 2430831

Statistical Framework for Planning a Shelf Life Program with Binary Performance Data

Crowder, Stephen V.
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Abstract

This document outlines a statistical framework for establishing a shelf-life program for components whose performance is measured by a binary response, usually ‘pass’ or ‘fail.’ The approach applies to both single measurement devices and repeated measurement devices. The high-level objective of these plans is to quickly detect any sizeable increase in fraction defective as the product ages. The statistical approach is to choose a sample size and monitoring technique that alarms when the fraction defective increases to an unacceptably high level, but does not alarm when the process is at nominal. The nominal (acceptable) fraction defective is used, and an increased fraction defective (unacceptable) is assumed as part of the control chart design. The control chart recommended for this problem is the Bernoulli Cumulative Sum (CUSUM) control chart.

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Crowder, Stephen V.. 2023-07-01. Statistical Framework for Planning a Shelf Life Program with Binary Performance Data. https://doi.org/10.2172/2430831

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