A Simplified Method for Predicting Shaker Voltage in IMMATs

Abstract

Impedance Matched Multi-Axis Tests (IMMATs) can replicate in-service vibration induced stress more accurately than single axis shaker table tests as they can better match a part’s operational boundary conditions and excite it in multiple degrees of freedom simultaneously. Here, the shakers used in IMMATs are less powerful than shaker tables, so shaker force limits can be exceeded during tests if they are not placed adequately for the desired environment. The ability to predict shaker voltage and force before performing a test is, therefore, helpful in selecting shaker locations so that their limits are not exceeded. In this study, electrodynamic shakers were modeled as discrete electromechanical systems, and the shaker parameters were chosen to match experimentally obtained acceleration/voltage frequency response functions (FRFs). These models were coupled to a finite element model of the device under test (DUT) via dynamic substructuring, and the substructured model was demonstrated to accurately predict shaker voltage as well as the error in reproducing the environment at multiple accelerometer locations. A simple method called the FRF Multiplication method, in which the FRF of the substructured system is approximated as the product of two separate FRFs of the shaker and DUT respectively, was proposed and applied to the same system, yielding similar voltage and error predictions to those obtained using substructuring. Simple case studies were presented to explore the applicability of the proposed method, and it was demonstrated to have similar accuracy to the substructuring method in a range of cases. Additionally, we showed that while it was not possible to derive a unique model of the shakers from acceleration/voltage FRFs alone, the models that could be obtained were sufficient to predict test error almost perfectly and shaker voltage with less than 40 percent error.