High Yield Xray Imager Final Design Review

Abstract

The High Yield Xray Imager (HYXI) is a new NIF target diagnostic system currently under development. The goal of HYXI is to provide high-fidelity, high temporal resolution x-ray imaging capability on high yield NIF implosions at 10MJ and above. The HYXI instrument design concept is based on the combination of two technologies that have been successfully utilized at the NIF on previous instruments, electron pulse-dilation and hybrid-CMOS sensor imaging. The combination of these two techniques will give HYXI sufficient data quality to ascertain differences in hot spot formation dynamics between high and low yield implosions. This information will highlight the critical hot spot conditions needed for ignition and burn. The HYXI design leverages the successful operation of the PDIXI x-ray imager at the NIF on multi MJ yield shots. A new radiation tolerant CMOS imaging array (HYPERION) is being developed to eliminate the significant background noise which limits the data quality of PDIXI. We successfully placed the contract with Advanced hCMOS Systems (AHS) to develop the HYPERION sensor, which fulfils our criteria to place long lead time item procurements by end of FY24. The HYXI Final Design Review was completed at the end of Q4 FY24 (Sep 24 th and Sep 30 th ). The HYXI project is a multi-year effort with a phased approach to be bring up system functionality over time in parallel with the development and fabrication effort of the HYPERION CMOS imaging array. In Phase 1, time-integrated x-ray images on NIF DT experiments will be collected starting in Q3 FY25. In Phase 2 of the project, time-resolved imaging with HYXI utilizing a spare microchannel plate detector back-end will begin in Q3 FY26. Phase 3 concludes the project with the installation of the HYPERION sensor array and the final performance qualification of the HYXI instrument which is scheduled for Q3 FY27 as discussed in the PDR and MRT report on this project in FY23.