DOE OSTI · 2507174
Automated High-Resolution Phase-Contrast Scanning Transmission Electron Microscopy
Abstract
Here, in this presentation, we demonstrate the operation and applications of a custom-built automation program to acquire high-resolution data on an aberration-corrected STEM.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Pattison, Alexander J., Pedroso, Cassio S., Cohen, Bruce E., Ondry, Justin C., Alivisatos, A. Paul, Theis, Wolfgang, Ercius, Peter. 2024-07-24. Automated High-Resolution Phase-Contrast Scanning Transmission Electron Microscopy. https://doi.org/10.1093/mam%2Fozae044.192
Cite the original work for its findings. Save a collection to share your selection of sources.