Relating Measured Component Damage to Assessed Component Reliability in Reliability Integrity Management (RIM)

Abstract

There is currently no widely agreed detailed general method for licensing a novel plant incorporating novel materials (or materials being deployed in novel environments); in many such situations, there are no directly applicable engineering code cases for decision-makers (including regulators) to rely on. It may be possible to develop an approach to licensing such a plant that is based on the Reliability and Integrity Management (RIM) approach delineated in ASME BPVC Section XI Division 2. NRC Regulatory Guide 1.246, Rev.0, endorses, with conditions, the subject portion of the ASME Code. But that portion of the ASME code is written at a very high level, and there are fundamental technical challenges associated with applying it literally to licensing a real plant. In the RIM approach, applicants need to do the following (among other things): • Allocate target reliabilities to structures, systems, and components (SSCs) that collectively support the top-level plant safety and availability objectives; • Understand failure modes of those SSCs, and the degradation mechanisms that could lead to those failure modes; • Develop and propose a program of surveillances that will identify degradation prior to failure of SSCs; • Provide a means of reporting results, taking actions for anomalous or undesirable conditions, and give the regulator assurance of continued safe operations. Applying RIM in a specific case will call for advances in the state of practice of relating physical observables to functional reliability of certain component types. Except where a given level of damage corresponds to a failed (or nearly failed) state, it is not practical to establish a precise quantitative relationship between physical observables and reliability. This paper focuses on managing risk of passive component failures based on observable damage parameters. A simple approach to cumulative damage modeling will be illustrated with a view to possible use in RIM applications.