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DOE OSTI · 2530887

Event-driven readout development: testing of the EDWARD65P1 chip with integrated event generators

Abstract

Building on a prototype readout integrated circuit for segmented silicon sensors with the EDWARD event-driven readout architecture, the front-end in each pixel was replaced by a hardware generator to verify readout performance, ensuring no data loss, consistent priority handling, and speed verification. Here, this generator produces Poisson-distributed readout requests with individually tunable rates per pixel via a digitally controlled oscillator. The resulting EDWARD65P1 test ASIC is a 32×32 pixel matrix with a 100 μm pitch, equipped with digital event generators simulating radiation hits at user-defined rates. Test results for this new design are presented.

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BibTeXRIS

Gorni, D. S. [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000196137180), Deptuch, G. W. [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000317036758), Maj, P. [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000210596376), Mandal, S. [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000190702337), Pinaroli, G. [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000167390339). 2025-03-11. Event-driven readout development: testing of the EDWARD65P1 chip with integrated event generators. https://doi.org/10.1088/1748-0221%2F20%2F03%2Fc03009

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