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DOE OSTI · 2533617

Anodized Aluminum Oxide Membrane Ionic Memristors

Abstract

Memory effect in ion transport (IT) at the solid–solution interface is uniquely attractive in that the conductance depends on or “memorizes” the previous states. Hysteretic and rectified transport properties offer exciting potential to developing advanced iontronics and neuromorphic functions, improving the efficiency of energy conversion and electrochemical processes, and overcoming the selectivity-throughput bottleneck in the enrichment of low abundant species for environment- and energy-friendly separations, among others. Herein, memory effects are discovered in the rectified electrokinetic IT through anodized aluminum oxide (AAO) membranes containing densely packed highly ordered nanochannels (10 10 per cm 2 ). Characteristic memristor responses of pinched current–potential loops are resolved in voltammetric experiments and successfully reproduced through finite element simulation. Excitatory and inhibitory conductance states are shown to arise from the enrichment and depletion of mobile charge carriers. Structurewise, the transport symmetry is broken by the barrier oxide layer (BOL) on the one end of the cylindrical nanochannels across the AAO membranes. Charge selectivity is attributed to the gradient(s) of the space charge density across the BOL characterized by depth profiling via X-ray photoelectron spectroscopy analysis. The space charge gradient(s) overcomes the fundamental limitation of widely exploited surface charge effects to enable intense rectification and hysteresis prevailing at very high ionic concentrations up to 1–2 M. A new strategy is developed for controlling the preferential IT direction and selectivity via counterion intercalation and extraction/exchange. Mechanistic understanding is further confirmed through parameter variations such as potential scan rate and ionic strength, which also demonstrates convenient controls of the related functions.

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BibTeXRIS

Baram, Dipak [Georgia State University, Atlanta, GA (United States)], Kvetny, Maksim [Georgia State University, Atlanta, GA (United States)], Ake, Sarah [Georgia State University, Atlanta, GA (United States)], Yang, Ruoyu [Georgia State University, Atlanta, GA (United States)], Wang, Gangli [Georgia State University, Atlanta, GA (United States)] (ORCID:0000000192047807). 2025-03-20. Anodized Aluminum Oxide Membrane Ionic Memristors. https://doi.org/10.1021/jacs.4c16835

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