DOE OSTI · 2564037
Scalable randomized benchmarking with mid-circuit measurements
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Hothem, Daniel George, Blume-Kohout, Robin J., Hines, Jordan, Proctor, Timothy James, Baldwin, Charles. 2024-03-01. Scalable randomized benchmarking with mid-circuit measurements. https://doi.org/10.2172/2564037
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