DOE OSTI · 2564790
Exploring the transferability of machine-learning models for analyzing XRD data of shocked microstructures: from single crystal to polycrystals
Abstract
This study explores the transferability of machine-learning models to analyze X-ray diffraction (XRD) profiles of shock-loaded single-crystal and polycrystalline data.
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Vizoso, Daniel [Center for Integrated Nanotechnologies, Sandia National Laboratories, NM, USA] (ORCID:0000000277336392), Tsurkan, Phillip [Department of Materials Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, CT, USA], Ma, Ke [Department of Materials Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, CT, USA], Dongare, Avinash M. [Department of Materials Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, CT, USA], Dingreville, Rémi [Center for Integrated Nanotechnologies, Sandia National Laboratories, NM, USA] (ORCID:000000031613695X). 2025-01-01. Exploring the transferability of machine-learning models for analyzing XRD data of shocked microstructures: from single crystal to polycrystals. https://doi.org/10.1039/d4dd00400k
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